248 Publications (Page 3 of 10)
2012
EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 28, (no. 3), pp. 263-264, Jun 2012.
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EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 28, (no. 2), pp. 151-152, Apr 2012.
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Parametric Fault Testing of Non-Linear Analog Circuits Based on Polynomial and V-Transform CoefficientsSindia, Suraj⋅Agrawal, Vishwani D and Singh, VirendraJournal of Electronic Testing, vol. 28, (no. 5), pp. 757-771, 2012.
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2011
EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 27, (no. 3), pp. 219, Jun 2011.
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EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 27, (no. 6), pp. 681-682, Dec 2011.
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EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 27, (no. 2), pp. 95, Apr 2011.
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EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 27, (no. 1), pp. 1-2, Feb 2011.
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EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 27, (no. 5), pp. 579, Oct 2011.
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EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 27, (no. 4), pp. 425-426, Aug 2011.
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Ultra Low Energy CMOS Logic Using Below-Threshold Dual-Voltage SupplyKim, Kyungseok and Agrawal, Vishwani DJournal of Low Power Electronics, vol. 7, (no. 4), pp. 460-470, 2011.
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2010
Authors' replySitholey, Prabhat⋅Agrawal, Vivek and Pargaonkar, AmolIndian Journal of Psychiatry, vol. 52, (no. 2), pp. 195-196, Apr 2010.
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Authors' reply.Sitholey, Prabhat⋅Agrawal, Vivek and Pargaonkar, AmolIndian journal of psychiatry, vol. 52, (no. 2), pp. 195-196, April 2010.
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EditorialAgrawal, VJournal of Electronic Testing : (JETTA), vol. 26, (no. 2), pp. 145, Apr 2010.
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EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 26, (no. 4), pp. 401, Aug 2010.
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EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 26, (no. 5), pp. 495, Oct 2010.
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EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 26, (no. 3), pp. 293, Jun 2010.
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EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 26, (no. 1), pp. 1-2, Feb 2010.
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EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 26, (no. 6), pp. 595-596, Dec 2010.
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2009
EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 25, (no. 6), pp. 285, Dec 2009.
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EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 25, (no. 1), pp. 1, Feb 2009.
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EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 25, (no. 4-5), pp. 209, Aug 2009.
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Variable Input Delay CMOS Logic for Low Power DesignRaja, T.⋅Agrawal, Vishwani D and Bushnell, MLIEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 17, (no. 10), pp. 1534-1545, 2009.
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2008
EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 24, (no. 6), pp. 505-506, Dec 2008.
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EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 24, (no. 5), pp. 421, Oct 2008.
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EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 24, (no. 1-3), pp. 1, Jun 2008.
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