248 Publications (Page 1 of 10)
2021
Estimating Operational Age of an Integrated Circuit⋅Singh, Adit D and Agrawal, Vishwani DJournal of Electronic Testing : (JETTA), vol. 37, (no. 1), pp. 25-40, Feb 2021.
| Journal Article
2020
Improved Pseudo-Random Fault Coverage Through Inversions: a Study on Test Point ArchitecturesMillican, Spencer K⋅Millican, Spencer K⋅Agrawal, Vishwani D and Agrawal, Vishwani DJournal of Electronic Testing : (JETTA), vol. 36, (no. 1), pp. 123-133, Feb 2020.
| Journal Article
Power-Aware Optimization of SoC Test Schedules Using Voltage and Frequency ScalingSheshadri, Vijay⋅Agrawal, Vishwani and Agrawal, PrathimaJournal of Electronic Testing : (JETTA), vol. 33, (no. 2), pp. 171-187, Apr 2017.
| Journal Article
Three-Stage Optimization of Pre-Bond Diagnosis of TSV DefectsZhang, Bei and Agrawal, Vishwani DJournal of Electronic Testing : (JETTA), vol. 33, (no. 5), pp. 573-589, Oct 2017.
| Journal Article
2016
Applications of Mixed-Signal Technology in Digital TestingLi, Baohu and Agrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 32, (no. 2), pp. 209-225, Apr 2016.
| Journal Article
2015
A Maximum Power Algorithm to Find Frequencies for Aperiodic Clock TestingGunasekar, Sindhu and Agrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 31, (no. 4), pp. 403-410, Aug 2015.
| Journal Article
Defect Level Constrained Optimization of Analog and Radio Frequency Specification TestsSindia, Suraj and Agrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 31, (no. 5-6), pp. 479-489, Dec 2015.
| Journal Article
EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 31, (no. 2), pp. 123, Apr 2015.
| Journal Article