248 Publications (Page 2 of 10)
2015
EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 31, (no. 3), pp. 225, Jun 2015.
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EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 31, (no. 2), pp. 123, Apr 2015.
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2014
A Novel Wafer Manipulation Method for Yield Improvement and Cost Reduction of 3D Wafer-on-Wafer Stacked ICsZhang, Bei and Agrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 30, (no. 1), pp. 57-75, Feb 2014.
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A Test Time Theorem and its ApplicationsVenkataramani, Praveen⋅Sindia, Suraj and Agrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 30, (no. 2), pp. 229-236, Apr 2014.
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Diagnostic Test Generation for Transition Delay Faults Using Stuck-At Fault Detection ToolsZhang, Yu⋅Zhang, Bei and Agrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 30, (no. 6), pp. 763-780, Dec 2014.
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EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 30, (no. 6), pp. 637-638, Dec 2014.
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EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 30, (no. 4), pp. 383-384, Aug 2014.
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EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 30, (no. 5), pp. 491-492, Oct 2014.
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EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 30, (no. 1), pp. 1-2, Feb 2014.
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EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 30, (no. 2), pp. 155-156, Apr 2014.
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EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 30, (no. 3), pp. 251-252, Jun 2014.
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2013
EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 29, (no. 5), pp. 617, Oct 2013.
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EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 29, (no. 2), pp. 121, Apr 2013.
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EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 29, (no. 1), pp. 1-2, Feb 2013.
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EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 29, (no. 3), pp. 255, Jun 2013.
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EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 29, (no. 4), pp. 453, Aug 2013.
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EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 29, (no. 6), pp. 741-742, Dec 2013.
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Neural Network Guided Spatial Fault Resilience in Array ProcessorsSindia, Suraj and Agrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 29, (no. 4), pp. 473-483, Aug 2013.
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2012
Defect Level and Fault Coverage in Coefficient Based Analog Circuit TestingSindia, Suraj⋅Agrawal, Vishwani and Singh, VirendraJournal of Electronic Testing : (JETTA), vol. 28, (no. 4), pp. 541-549, Aug 2012.
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Diagnostic Test Set Minimization and Full-Response Fault DictionaryShukoor, Mohammed A and Agrawal, Vishwani DJournal of Electronic Testing, vol. 28, (no. 2), pp. 177-187, 2012.
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EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 28, (no. 4), pp. 389-390, Aug 2012.
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EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 28, (no. 5), pp. 551-552, Oct 2012.
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EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 28, (no. 1), pp. 1, Feb 2012.
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EditorialAgrawal, VishwaniJournal of Electronic Testing : (JETTA), vol. 28, (no. 2), pp. 151-152, Apr 2012.
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