248 Publications (Page 1 of 10)
2021
Estimating Operational Age of an Integrated Circuit
⋅Singh, Adit D and Agrawal, Vishwani D
Journal of Electronic Testing : (JETTA), vol. 37, (no. 1), pp. 25-40, Feb 2021. | Journal Article
2020
Improved Pseudo-Random Fault Coverage Through Inversions: a Study on Test Point Architectures
Millican, Spencer K⋅Millican, Spencer K⋅Agrawal, Vishwani D and Agrawal, Vishwani D
Journal of Electronic Testing : (JETTA), vol. 36, (no. 1), pp. 123-133, Feb 2020. | Journal Article
2018
Editorial
Agrawal, Vishwani
(pp. 1-1). Feb 2018
 
Editorial
Agrawal, Vishwani
(pp. 1-1). Apr 2018
 
Editorial
Agrawal, Vishwani
(pp. 209-209). Jun 2018
2017
Editorial
Agrawal, Vishwani
(pp. 275). Jun 2017
 
Editorial
Agrawal, Vishwani
(pp. 141). Apr 2017
 
Editorial
Agrawal, Vishwani
(pp. 377-378). Aug 2017
 
Editorial
Agrawal, Vishwani
(pp. 539-540). Oct 2017
 
Editorial
Agrawal, Vishwani
(pp. 1-3). Feb 2017
 
Editorial
Agrawal, Vishwani
(pp. 689-690). Dec 2017
 
Power-Aware Optimization of SoC Test Schedules Using Voltage and Frequency Scaling
Sheshadri, Vijay⋅Agrawal, Vishwani and Agrawal, Prathima
Journal of Electronic Testing : (JETTA), vol. 33, (no. 2), pp. 171-187, Apr 2017. | Journal Article
 
Three-Stage Optimization of Pre-Bond Diagnosis of TSV Defects
Zhang, Bei and Agrawal, Vishwani D
Journal of Electronic Testing : (JETTA), vol. 33, (no. 5), pp. 573-589, Oct 2017. | Journal Article
2016
Applications of Mixed-Signal Technology in Digital Testing
Li, Baohu and Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 32, (no. 2), pp. 209-225, Apr 2016. | Journal Article
 
Editorial
Agrawal, Vishwani
(pp. 1-2). Feb 2016
 
Editorial
Agrawal, Vishwani
(pp. 505-506). Oct 2016
 
Editorial
Agrawal, Vishwani
(pp. 107-108). Apr 2016
 
Editorial
Agrawal, Vishwani
(pp. 399). Aug 2016
 
Editorial
Agrawal, Vishwani
(pp. 241-242). Jun 2016
 
Editorial
Agrawal, Vishwani
(pp. 653-654). Dec 2016
2015
A Maximum Power Algorithm to Find Frequencies for Aperiodic Clock Testing
Gunasekar, Sindhu and Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 31, (no. 4), pp. 403-410, Aug 2015. | Journal Article
 
Defect Level Constrained Optimization of Analog and Radio Frequency Specification Tests
Sindia, Suraj and Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 31, (no. 5-6), pp. 479-489, Dec 2015. | Journal Article
 
Editorial
Agrawal, Vishwani
(pp. 335). Aug 2015
 
Editorial
Agrawal, Vishwani
(pp. 421-422). Dec 2015
 
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 31, (no. 2), pp. 123, Apr 2015. | Journal Article