248 Publications (Page 2 of 10)
2015
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 31, (no. 3), pp. 225, Jun 2015. | Journal Article
 
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 31, (no. 2), pp. 123, Apr 2015. | Journal Article
2014
A Novel Wafer Manipulation Method for Yield Improvement and Cost Reduction of 3D Wafer-on-Wafer Stacked ICs
Zhang, Bei and Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 30, (no. 1), pp. 57-75, Feb 2014. | Journal Article
 
A Test Time Theorem and its Applications
Venkataramani, Praveen⋅Sindia, Suraj and Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 30, (no. 2), pp. 229-236, Apr 2014. | Journal Article
 
Diagnostic Test Generation for Transition Delay Faults Using Stuck-At Fault Detection Tools
Zhang, Yu⋅Zhang, Bei and Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 30, (no. 6), pp. 763-780, Dec 2014. | Journal Article
 
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 30, (no. 6), pp. 637-638, Dec 2014. | Journal Article
 
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 30, (no. 4), pp. 383-384, Aug 2014. | Journal Article
 
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 30, (no. 5), pp. 491-492, Oct 2014. | Journal Article
 
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 30, (no. 1), pp. 1-2, Feb 2014. | Journal Article
 
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 30, (no. 2), pp. 155-156, Apr 2014. | Journal Article
 
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 30, (no. 3), pp. 251-252, Jun 2014. | Journal Article
2013
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 29, (no. 5), pp. 617, Oct 2013. | Journal Article
 
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 29, (no. 2), pp. 121, Apr 2013. | Journal Article
 
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 29, (no. 1), pp. 1-2, Feb 2013. | Journal Article
 
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 29, (no. 3), pp. 255, Jun 2013. | Journal Article
 
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 29, (no. 4), pp. 453, Aug 2013. | Journal Article
 
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 29, (no. 6), pp. 741-742, Dec 2013. | Journal Article
 
Eliminating the Timing Penalty of Scan
Sinanoglu, Ozgur and Agrawal, Vishwani D
Journal of Electronic Testing, vol. 29, (no. 1), pp. 103-114, 2013. | Journal Article
 
Neural Network Guided Spatial Fault Resilience in Array Processors
Sindia, Suraj and Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 29, (no. 4), pp. 473-483, Aug 2013. | Journal Article
2012
Defect Level and Fault Coverage in Coefficient Based Analog Circuit Testing
Sindia, Suraj⋅Agrawal, Vishwani and Singh, Virendra
Journal of Electronic Testing : (JETTA), vol. 28, (no. 4), pp. 541-549, Aug 2012. | Journal Article
 
Diagnostic Test Set Minimization and Full-Response Fault Dictionary
Shukoor, Mohammed A and Agrawal, Vishwani D
Journal of Electronic Testing, vol. 28, (no. 2), pp. 177-187, 2012. | Journal Article
 
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 28, (no. 4), pp. 389-390, Aug 2012. | Journal Article
 
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 28, (no. 5), pp. 551-552, Oct 2012. | Journal Article
 
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 28, (no. 1), pp. 1, Feb 2012. | Journal Article
 
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 28, (no. 2), pp. 151-152, Apr 2012. | Journal Article