12 Patents
n.d.no date or unknown
Cost-Function Directed Search Method For Generating Test For Sequential Logic Circuits
Agrawal, Prathima⋅Agrawal, Vishwani D and Cheng, Kwang T (Inventors).
CA1315016
 
Cost-function directed search method for generating tests for sequential logic circuits
Agrawal, Prathima⋅Agrawal, Vishwani D and Cheng, Kwang T (Inventors).
5257268
 
Delay testing of high-performance digital components by a slow-speed tester
Agrawal, Vishwani D and Chakraborty, Tapan J (Inventors).
5606567
 
Low power circuits through hazard pulse suppression
Agrawal, Vishwani D (Inventor).
5983007
 
Method and apparatus for test generation and fault simulation for sequential circuits with embedded random access memories (RAMs)
Agrawal, Vishwani D and Chakraborty, Tapan J (Inventors).
5499249
 
Method and integrated circuit adapted for partial scan testability
Agrawal, Vishwani D and Cheng, Kwang-Ting (Inventors).
5043986
 
Method and system for identifying tested path delay faults
Bushnell, Michael⋅Gharaybeh, Marwan A and Agrawal, Vishwani D (Inventors).
6131181
 
Method for testing delay faults in non-scan sequential circuits
Agrawal, Vishwani D and Chakraborty, Tapan J (Inventors).
5365528
 
Scan testable integrated circuit
Agrawal, Vishwani D and Mercer, Melvin R (Inventors).
4493077
 
Testable implementations of finite state machines and methods for producing them
Agrawal, Vishwani D and Cheng, Kwang-Ting (Inventors).
5228040
 
Testing and removal of redundancies in VLSI circuits with non-boolean primitives
Chakradhar Srimat, T.⋅Rothweiler, Steven G and Agrawal, Vishwani D (Inventors).
5657240
 
Testing a sequential circuit
Abramovici, Miron⋅Agrawal, Vishwani D⋅Cheng, Kwang-Ting and Rajan, Krishna B (Inventors).
5590135