248 Publications (Page 4 of 10)
2008
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 24, (no. 1-3), pp. 1, Jun 2008. | Journal Article
2007
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 23, (no. 6), pp. 465, Dec 2007. | Journal Article
 
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 23, (no. 2-3), pp. 111, Jun 2007. | Journal Article
 
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 23, (no. 5), pp. 369, Oct 2007. | Journal Article
 
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 23, (no. 1), pp. 5, Feb 2007. | Journal Article
 
Graphical IDDQ Signatures Reduce Defect Level and Yield Loss
Rao, L.⋅Bushnell, Michael and Agrawal, Vishwani D
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 15, (no. 11), 2007. | Journal Article
2006
CMOS Leakage and Glitch Minimization for Power-Performance Tradeoff
Lu, Yuanlin and Agrawal, Vishwani D
Journal of Low Power Electronics, vol. 2, (no. 3), pp. 378-387, 2006. | Journal Article
 
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 22, (no. 4-6), pp. 307, Dec 2006. | Journal Article
 
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 22, (no. 1), pp. 5, Feb 2006. | Journal Article
 
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 22, (no. 2), pp. 111, Apr 2006. | Journal Article
 
Input-specific dynamic power optimization for VLSI circuits
Hu, Fei and Agrawal, Vishwani D
International Symposium on Low Power Electronics and Design: Proceedings of the 2006 international symposium on Low power electronics and design; 04-06 Oct. 2006. 2006. | Conference Proceeding
 
Transistor Sizing of Logic Gates to Maximize Input Delay Variability
Raja, Tezaswi⋅Agrawal, Vishwani D and Bushnell, Michael L
Journal of Low Power Electronics, vol. 2, (no. 1), pp. 121-128, 2006. | Journal Article
2005
Combinational automatic test pattern generation for acyclic sequential circuits
Kim, Yong C⋅Agrawal, Vishwani D and Saluja, Kewal K
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 24, (no. 6), pp. 948-956, 2005. | Journal Article
 
Diagnostic and Detection Fault Collapsing for Multiple Output Circuits
Sandireddy, Raja K and Agrawal, Vishwani D
Design, Automation, and Test in Europe: Proceedings of the conference on Design, Automation and Test in Europe - Volume 2; 07-11 Mar. 2005. 2005. | Conference Proceeding
 
Dual-transition glitch filtering in probabilistic waveform power estimation
Hu, Fei and Agrawal, Vishwani D
Great Lakes Symposium on VLSI: Proceedings of the 15th ACM Great Lakes symposium on VLSI; 17-19 Apr. 2005. 2005. | Conference Proceeding
 
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 21, (no. 5), pp. 459, Oct 2005. | Journal Article
 
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 21, (no. 1), pp. 5, Feb 2005. | Journal Article
 
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 21, (no. 2), pp. 111, Apr 2005. | Journal Article
 
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 21, (no. 3), pp. 199, Jun 2005. | Journal Article
 
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 21, (no. 6), pp. 567, Dec 2005. | Journal Article
2004
A new classification of path-delay fault testability in terms of stuck-at faults
Majumder, Subhashis⋅Bhattacharya, Bhargab B⋅Agrawal, Vishwani D and Bushnell, Michael L
Journal of Computer Science and Technology, vol. 19, (no. 6), pp. 955-964, 2004. | Journal Article
 
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 20, (no. 2), pp. 127, Apr 2004. | Journal Article
 
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 20, (no. 1), pp. 5-6, Feb 2004. | Journal Article
 
Editorial
Agrawal, Vishwani D
Journal of Electronic Testing : (JETTA), vol. 20, (no. 6), pp. 571, Dec 2004. | Journal Article
 
Editorial
Agrawal, Vishwani
Journal of Electronic Testing : (JETTA), vol. 20, (no. 3), pp. 219, Jun 2004. | Journal Article