37 Publications (Page 1 of 2)
2009
On Built-In Self-Test for Adders
Pulukuri, Mary D and Stroud, Charles E
Journal of Electronic Testing, vol. 25, (no. 6), pp. 343-346, 2009. | Journal Article
2007
FPGA-Based Analog Functional Measurements for Adaptive Control in Mixed-Signal Systems
Qin, Jie⋅Stroud, Charles E and Dai, Fa F
IEEE Transactions on Industrial Electronics, vol. 54, (no. 4), pp. 1885-1897, 2007. | Journal Article
2006
An Automated BIST Architecture for Testing and Diagnosing FPGA Interconnect Faults
Smith, Jack⋅Xia, Tian and Stroud, Charles E
Journal of Electronic Testing, vol. 22, (no. 3), pp. 239-253, 2006. | Journal Article
 
Automatic linearity and frequency response tests with built-in pattern generator and analyzer
Fa Dai, F.⋅Stroud, Charles E and Yang, Dayu
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 14, (no. 6), 2006. | Journal Article
2003
BIST-based delay-fault testing in FPGAs.
Abramovici, M. and Stroud, Charles E
Journal of Electronic Testing, vol. 19, (no. 5), pp. 549-558, 2003. | Journal Article
2002
A Desiger's Guide to Built-In Self-Test
Stroud, Charles E
Kluwer Academic Publishers. 2002. | Book
 
Using embedded FPGAs for SoC yield improvement
Abramovici, Miron⋅Stroud, Charles E and Emmert, Marty
Proceedings - Design Automation Conference. pp. 713-724. 2002, 2002. | Journal Article
 
Using embedded FPGAs for SoC yield improvement
Abramovici, Miron⋅Stroud, Charles E and Emmert, Marty
Annual ACM IEEE Design Automation Conference: Proceedings of the 39th conference on Design automation : New Orleans, Louisiana, USA; 10-14 June 2002. 2002. | Conference Proceeding
2001
BIST-based test and diagnosis of FPGA logic blocks
Abramovici, M. and Stroud, Charles E
IEEE TRANS VERY LARGE SCALE INTEGR VLSI SYST, vol. 9, (no. 1), pp. 159-172, 2001. | Journal Article
2000
A New Method for Testing Re-Programmable PLAs
Stroud, Charles⋅Bailey, James and Emmert, Johan
Journal of Electronic Testing : (JETTA), vol. 16, (no. 6), pp. 635-640, Dec 2000. | Journal Article
 
Computer aided routing for complex programmable logic device manufacturing test development
Vocke, Nick J⋅Stroud, Charles E⋅Heath, J. R⋅Orso, William R and Chhor, Khushru S
CONF PROC IEEE SOUTHEASTCON. pp. 171-176. 2000, 2000. | Journal Article
 
New bridging fault model for more accurate fault behavior
Emmert, John M⋅Stroud, Charles E and Bailey, James R
AUTOTESTCON PROC. pp. 481-485. 2000, 2000. | Journal Article
 
New method for testing re-programmable PLAs
Stroud, Charles E⋅Bailey, James R and Emmert, John M
J ELECTRON TEST THEORY APPL JETTA, vol. 16, (no. 6), pp. 635-640, 2000. | Journal Article
1999
Mixed Signal Built-In Self-Test for Analog Circuits
Stroud, Charles E and Bradley, Eugene B
1999. | Journal Article
1998
Delay fault analysis using discrete event system approach
Westerman, Glenn⋅Stroud, Charles E⋅Heath, J. R and Kumar, Ratnesh
AUTOTESTCON '98; Proceedings of the System Readiness Technology Conference, Salt Lake City, UT; UNITED STATES; 24-27 Aug. 1998. 1998. | Conference Proceeding
 
Discrete Event System approach for delay fault analysis in digital circuits
Westerman, Glenn⋅Kumar, Ratnesh⋅Stroud, Charles E and Heath, J. R
1998 American Control Conference, Philadelphia, PA; UNITED STATES; 24-26 June 1998. 1998. | Conference Proceeding
1997
BIST-based diagnostics of FPGA logic blocks
Stroud, Charles E⋅Lee, Eric and Abramovici, Miron
IEEE INT TEST CONF TC. pp. 539-547. 1997, 1997. | Journal Article
 
Parameterized VHDL library for on-line testing
Stroud, Charles E⋅Ding, M.⋅Seshadri, S.⋅Kim, I.⋅Roy, S.⋅Wu, S. and Karri, R.
IEEE INT TEST CONF TC. pp. 479-488. 1997, 1997. | Journal Article
 
Self-test for FPGAs and CPLDs requires no overhead
Abramovici, Miron⋅Lee, Eric⋅Stroud, Charles E and Underwood, Mark
E D N Magazine, vol. 42, (no. 23), pp. 121-128, 1997. | Journal Article
1996
Design automation tools for Built-In Self-Test implementations
Tungate, Stan⋅He, Ping⋅Seshadri, Sowmya⋅Stroud, Charles E⋅Sullivan, Malissa and Damarla, T. R
AUTOTESTCON '96: Proceedings of the System Readiness Technology Conference, Dayton, OH; UNITED STATES; 16-19 Sept. 1996. 1996. | Conference Proceeding
 
Design of signature registers for double error bit identification
Damarla, T. R and Stroud, Charles E
PROC IEEE INT SYMP CIRCUITS SYST, vol. 4, pp. 65-68, 1996. | Journal Article
 
Register size vs. fault coverage in modified Circular Built-In Self-Test
Stroud, Charles E⋅He, Ping and Damarla, T. R
AUTOTESTCON '96: Proceedings of the System Readiness Technology Conference, Dayton, OH; UNITED STATES; 16-19 Sept. 1996. 1996. | Conference Proceeding
 
Selecting Built-In Self-Test configurations for field programmable gate arrays
Stroud, Charles E⋅Lee, Eric⋅Konala, Srinivasa and Abramovici, Miron
AUTOTESTCON '96: Proceedings of the System Readiness Technology Conference, Dayton, OH; UNITED STATES; 16-19 Sept. 1996. 1996. | Conference Proceeding
 
Using ILA testing for BIST in FPGAs
Stroud, Charles E⋅Lee, Eric⋅Konala, Srinivasa and Abramovici, Miron
The 1996 IEEE International Test Conference; Washington, DC; USA; 20-24 Oct. 1996. 1996. | Conference Proceeding
1995
A built-in self test scheme for VLSI
Damarla, T. R⋅Su, Wei⋅Michael, Gerald T⋅Chung, Moon J and Stroud, Charles E
with EDA Technofair Design Automation Conference Asia and South Pacific: Proceedings of the 1995 conference on Asia Pacific design automation (CD-ROM); 29 Aug.-01 Sept. 1995. 1995. | Conference Proceeding