26 Patents (Page 1 of 2)
2005
Fault Tolerant Operation of Reconfigurable Devices Using an Adjustable System Clock
Stroud, Charles E (Inventor).
US 6874108. (Issued 2005)
2003
On-Line Fault Tolerant Operation via Incremental Reconfiguration of Field Programmable Gate Arrays
Stroud, Charles E (Inventor).
US 6530049. (Issued 2003)
 
On-Line Testing of Field Programmable Gate Array Logic Resources
Stroud, Charles E (Inventor).
US 6631487. (Issued 2003)
 
On-Line Testing of Programmable Interconnect Network in Field Programmable Gate Arrays
Stroud, Charles E (Inventor).
US 6574761. (Issued 2003)
 
On-Line Testing of Programmable Logic Blocks in Field Programmable Gate Arrays
Stroud, Charles E (Inventor).
US 6550030. (Issued 2003)
2001
Fault Tolerant Operation of Field Programmable Gate Arrays
Stroud, Charles E (Inventor).
US 6256758. (Issued 2001)
 
Method and Apparatus for Testing Field Programmable Gate Array Interconnect
Stroud, Charles E (Inventor).
US 6202182. (Issued 2001)
2000
Method of Testing and Diagnosing Field Programmable Gate Arrays
Stroud, Charles E (Inventor).
US 6108806. (Issued 2000)
1999
Maintenance Registers with Boundary Scan Interface
Stroud, Charles E (Inventor).
US 6052808. (Issued 1999)
 
Method and Apparatus for Testing Field Programmable Gate Arrays
Stroud, Charles E (Inventor).
US 5991907. (Issued 1999)
 
Method for Testing Field Programmable Gate Array Logic
Stroud, Charles E (Inventor).
US 6003150. (Issued 1999)
1993
Built-In Self-Test (BIST) Circuit
Stroud, Charles E (Inventor).
US 5230000. (Issued 1993)
 
Digital Signal Processor Synchronous Network
Stroud, Charles E (Inventor).
US 5251208. (Issued 1993)
1989
Integrated Circuit with Memory Self-Test
Stroud, Charles E (Inventor).
US 4872168. (Issued 1989)
n.d.no date or unknown
Automatic analog test and compensation with built-in pattern generator and analyzer
Dai, Fa F and Stroud, Charles E (Inventors).
7428683
 
Built-in self-test (BIST) circuit
Mozingo, Kenneth D and Stroud, Charles E (Inventors).
5230000
 
Digital signal processor synchronous network
Canniff, Ronald J⋅Chao, Philip C⋅Matten, Alan H and Stroud, Charles E (Inventors).
5251208
 
Fault tolerant operation of field programmable gate arrays
Abramovici, Miron⋅Emmert, John M and Stroud, Charles E (Inventors).
6973608
 
Identifying faulty programmable interconnect resources of field programmable gate arrays
Abramovici, Miron and Stroud, Charles E (Inventors).
6966020
 
Integrated Circuit With Memory Self-Test
Aadsen, Duane R⋅Jain, Sunil K and Stroud, Charles E (Inventors).
CA1299289
 
Maintenance registers with Boundary Scan interface
Wu, Shianling⋅Karri, Ramesh and Stroud, Charles E (Inventors).
6052808
 
Method and apparatus for testing field programmable gate arrays
Abramovici, Miron⋅Stroud, Charles E and Wijesuriya, Sajitha S (Inventors).
6202182
 
Method for testing field programmable gate arrays
Stroud, Charles E and Abramovici, Miron (Inventors).
5991907
 
Method for testing field programmable gate arrays
Stroud, Charles E and Abramovici, Miron (Inventors).
6003150
 
Method of testing and diagnosing field programmable gate arrays
Abramovici, Miron⋅Lee, Eric S and Stroud, Charles E (Inventors).
6108806