Expertise

BIST for SoCs

BIST for Mixed-Signal Systems

BIST for FPGAs and CPLDs

BIST for Regular Structures

BIST for Digital VLSI & ASICs

Other Design & Test Topics Built-In Self-Test (BIST) and Design for Testability (DFT) for digital and mixed-signal systems; VLSI design and testing including System-on-Chips (SoCs); Field Programmable Gate Arrays (FPGAs); and Complex Programmable Logic Devices (CPLDs).

Past Affiliations

Professor Emeritus, Department of Electrical & Computer Engineering, Samuel Ginn College of Engineering, Auburn University

Professor, Department of Electrical & Computer Engineering, Samuel Ginn College of Engineering, Auburn University

Professor, Wireless Engineering Research and Education Center, Samuel Ginn College of Engineering, Auburn University

Distinguished Member of Technical Staff, AT&T Bell Laboratories
1977 - 1993

Professor, Department of Electrical and Computer Engineering, William States Lee College of Engineering, University of North Carolina at Charlotte (past)
2000 - 2003

Associate Professor, Electrical Engineering, College of Engineering, University of Kentucky (past)
1993 - 2000

Degrees
PhD, University of Illinois at Chicago, Electrical Engineering & Computer Science, 1991
MS, University of Kentucky, Electrical Engineering, 1977
BS, University of Kentucky, Electrical Engineering, 1976
Keywords
electrical engineering or electronics integrated circuits computer engineering & hardware
Associations
Institute of Electrical and Electronics Engineers