Research applications for MeV ion accelerators - including semiconductor materials analysis using the techniques of heavy ion implantation (HII), Rutherford backscattering (RBS), light ion channeling (LIC), proton induced x-ray emission (PIXE) and nuclear reaction analysis (NRA).
Electrical characterization of wide band gap semiconductor materials, device fabrication and characterization.
- Research Area: Condensed Matter Physics
- Focus: Wide band gap semiconductor technology development - ion beam materials modification/analysis
