Damage detection and identification in smart structures using SVM and ANNFarooq, M.⋅Zheng, H.⋅Nagabhushana, A.⋅Roy, S.⋅Burkett, S.⋅Barkey, M.⋅Kotru, S. and Sazonov, E.Proceedings of SPIE - The International Society for Optical Engineering, vol. 8346. | Conference Proceeding