Expertise

Current research interests of Professor Rys are in areas of low-temperature testing of CMOS circuits and the electrical, optical and structural characterization of AlN and BN thin films for optoelectronic and rf device applications and the device modeling. 

Communities
Electrical Engineering, Computer Engineering
Degrees
PhD, Texas Tech University, Electrical Engineering, 1983
MS, Technical University of Wroclaw, Poland, Electronics Engineering, 1978
BS, Technical University of Wroclaw, Poland, Electronics Engineering, 1978