AFIA: ATPG-Guided Fault Injection Attack on Secure Logic Locking
Zhong, Yadi⋅Jain, Ayush⋅Rahman, M. Tanjidur⋅Asadizanjani, Navid⋅Xie, Jiafeng and Guin, Ujjwal
Journal of Electronic Testing : (JETTA), vol. 38, (no. 5), pp. 527-546, Oct 2022. | Journal Article