16 Publications
2022
A Systematic Bit Selection Method for Robust SRAM PUFs
Wang, WendongSingh, Adit D. and Guin, Ujjwal
Journal of Electronic Testing : (JETTA), vol. 38, (no. 3), pp. 235-246, Jun 2022. | Journal Article
 
Decision model with quantification of buyer-supplier trust in advanced technology enterprises
Collier, Zachary AGuin, UjjwalSarkis, Joseph and Lambert, James H
Benchmarking, vol. 29, (no. 10), pp. 3033-3056, 2022. | Journal Article
2020
End-to-End Traceability of ICs in Component Supply Chain for Fighting Against Recycling
Zhang, YuqiaoZhang, YuqiaoGuin, Ujjwal and Guin, Ujjwal
IEEE Transactions on Information Forensics and Security, vol. 15, pp. 775, 20200000. | Journal Article
2019
A Blockchain-Based Framework for Supply Chain Provenance
Cui, PinchenDixon, JulieGuin, Ujjwal and Dimase, Daniel
IEEE Access, vol. 7, pp. 1, 20191025. | Journal Article
 
Blockchain in IoT: Current Trends, Challenges, and Future Roadmap
Cui, PinchenGuin, UjjwalSkjellum, Anthony and Umphress, David
Journal of Hardware and Systems Security, vol. 3, (no. 4), pp. 364, 2019-12-00. | Journal Article
 
Low-Cost and Secure Firmware Obfuscation Method for Protecting Electronic Systems From Cloning
Cyr, BenjaminCyr, BenjaminMahmod, JubayerMahmod, JubayerGuin, Ujjwal and Guin, Ujjwal
IEEE Internet of Things Journal, vol. 6, (no. 2), pp. 3711, 2019-April. | Journal Article
 
Standards for Hardware Security
Guin, UjjwalAsadizanjani, Navid and Tehranipoor, Mark
GetMobile: Mobile Computing and Communications, vol. 23, (no. 1), pp. 9, 07-24-2019. | Journal Article
 
TAAL: Tampering Attack on Any Key-based Logic Locked Circuits
Jain, AyushZhou, Ziqi and Guin, Ujjwal
2019-09-16. | Journal Article
2018
Robust Design-for-Security Architecture for Enabling Trust in IC Manufacturing and Test
Guin, UjjwalGuin, UjjwalGuin, UjjwalZhou, ZiqiZhou, ZiqiZhou, ZiqiSingh, AditSingh, Adit and Singh, Adit
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 26, (no. 5), pp. 830, 2018-May. | Journal Article
2017
Invasion of the hardware snatchers
Tehranipoor, Mark MGuin, Ujjwal and Bhunia, Swarup
IEEE Spectrum, vol. 54, (no. 5), pp. 41, 2017-May. | Journal Article
 
SMA: A System-Level Mutual Authentication for Protecting Electronic Hardware and Firmware
Guin, UjjwalGuin, UjjwalBhunia, SwarupBhunia, SwarupForte, DomenicForte, DomenicTehranipoor, Mark M and Tehranipoor, Mark
IEEE Transactions on Dependable and Secure Computing, vol. 14, (no. 3), pp. 278, 2017-May-June-1. | Journal Article
 
TSensors Vision, Infrastructure and Security Challenges in Trillion Sensor Era
Alam, MahabubulAlam, MahabubulGuin, UjjwalTehranipoor, MarkTehranipoor, Mark M.Guin, Ujjwal and Guin, Ujjwal
Journal of Hardware and Systems Security, vol. 1, (no. 4), pp. 327, 20171200. | Journal Article
2016
FORTIS
Guin, UjjwalGuin, UjjwalShi, QihangShi, QihangForte, DomenicForte, DomenicTehranipoor, Mark and Tehranipoor, Mark
ACM Transactions on Design Automation of Electronic Systems (TODAES), vol. 21, (no. 4), pp. 20, 09-22-2016. | Journal Article
2014
A Comprehensive Framework for Counterfeit Defect Coverage Analysis and Detection Assessment
Guin, UjjwalGuin, UjjwalDimase, DanielDiMase, DanielDiMase, DanielTehranipoor, Mohammad and Tehranipoor, Mohammad
Journal of Electronic Testing, vol. 30, (no. 1), pp. 40, 20140200. | Journal Article
 
Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain
Guin, UjjwalGuin, UjjwalHuang, KeKe HuangDiMase, DanielDiMase, DanielCarulli, John MCarulli, John MTehranipoor, MohammadTehranipoor, MohammadMakris, Yiorgos and Makris, Yiorgos
Proceedings of the IEEE, vol. 102, (no. 8), pp. 1228, 2014-Aug.. | Journal Article
 
Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead
Guin, UjjwalDimase, DanielDiMase, Daniel and Tehranipoor, Mohammad
Journal of Electronic Testing : (JETTA), vol. 30, (no. 1), pp. 9-23, Feb 2014. | Journal Article