17 Publications
2022
AFIA: ATPG-Guided Fault Injection Attack on Secure Logic Locking
Zhong, Yadi⋅Jain, Ayush⋅Rahman, M. Tanjidur⋅Asadizanjani, Navid⋅Xie, Jiafeng and Guin, Ujjwal
Journal of Electronic Testing : (JETTA), vol. 38, (no. 5), pp. 527-546, Oct 2022. | Journal Article
 
A Systematic Bit Selection Method for Robust SRAM PUFs
Wang, Wendong⋅Singh, Adit D. and Guin, Ujjwal
Journal of Electronic Testing : (JETTA), vol. 38, (no. 3), pp. 235-246, Jun 2022. | Journal Article
 
Decision model with quantification of buyer-supplier trust in advanced technology enterprises
Collier, Zachary A⋅Guin, Ujjwal⋅Sarkis, Joseph and Lambert, James H
Benchmarking, vol. 29, (no. 10), pp. 3033-3056, 2022. | Journal Article
2020
End-to-End Traceability of ICs in Component Supply Chain for Fighting Against Recycling
Zhang, Yuqiao⋅Zhang, Yuqiao⋅Guin, Ujjwal and Guin, Ujjwal
IEEE Transactions on Information Forensics and Security, vol. 15, pp. 775, 20200000. | Journal Article
2019
A Blockchain-Based Framework for Supply Chain Provenance
Cui, Pinchen⋅Dixon, Julie⋅Guin, Ujjwal and Dimase, Daniel
IEEE Access, vol. 7, pp. 1, 20191025. | Journal Article
 
Blockchain in IoT: Current Trends, Challenges, and Future Roadmap
Cui, Pinchen⋅Guin, Ujjwal⋅Skjellum, Anthony and Umphress, David
Journal of Hardware and Systems Security, vol. 3, (no. 4), pp. 364, 2019-12-00. | Journal Article
 
Low-Cost and Secure Firmware Obfuscation Method for Protecting Electronic Systems From Cloning
Cyr, Benjamin⋅Cyr, Benjamin⋅Mahmod, Jubayer⋅Mahmod, Jubayer⋅Guin, Ujjwal and Guin, Ujjwal
IEEE Internet of Things Journal, vol. 6, (no. 2), pp. 3711, 2019-April. | Journal Article
 
Standards for Hardware Security
Guin, Ujjwal⋅Asadizanjani, Navid and Tehranipoor, Mark
GetMobile: Mobile Computing and Communications, vol. 23, (no. 1), pp. 9, 07-24-2019. | Journal Article
 
TAAL: Tampering Attack on Any Key-based Logic Locked Circuits
Jain, Ayush⋅Zhou, Ziqi and Guin, Ujjwal
2019-09-16. | Journal Article
2018
Robust Design-for-Security Architecture for Enabling Trust in IC Manufacturing and Test
Guin, Ujjwal⋅Guin, Ujjwal⋅Guin, Ujjwal⋅Zhou, Ziqi⋅Zhou, Ziqi⋅Zhou, Ziqi⋅Singh, Adit⋅Singh, Adit and Singh, Adit
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 26, (no. 5), pp. 830, 2018-May. | Journal Article
2017
Invasion of the hardware snatchers
Tehranipoor, Mark M⋅Guin, Ujjwal and Bhunia, Swarup
IEEE Spectrum, vol. 54, (no. 5), pp. 41, 2017-May. | Journal Article
 
SMA: A System-Level Mutual Authentication for Protecting Electronic Hardware and Firmware
Guin, Ujjwal⋅Guin, Ujjwal⋅Bhunia, Swarup⋅Bhunia, Swarup⋅Forte, Domenic⋅Forte, Domenic⋅Tehranipoor, Mark M and Tehranipoor, Mark
IEEE Transactions on Dependable and Secure Computing, vol. 14, (no. 3), pp. 278, 2017-May-June-1. | Journal Article
 
TSensors Vision, Infrastructure and Security Challenges in Trillion Sensor Era
Alam, Mahabubul⋅Alam, Mahabubul⋅Guin, Ujjwal⋅Tehranipoor, Mark⋅Tehranipoor, Mark M.⋅Guin, Ujjwal and Guin, Ujjwal
Journal of Hardware and Systems Security, vol. 1, (no. 4), pp. 327, 20171200. | Journal Article
2016
FORTIS
Guin, Ujjwal⋅Guin, Ujjwal⋅Shi, Qihang⋅Shi, Qihang⋅Forte, Domenic⋅Forte, Domenic⋅Tehranipoor, Mark and Tehranipoor, Mark
ACM Transactions on Design Automation of Electronic Systems (TODAES), vol. 21, (no. 4), pp. 20, 09-22-2016. | Journal Article
2014
A Comprehensive Framework for Counterfeit Defect Coverage Analysis and Detection Assessment
Guin, Ujjwal⋅Guin, Ujjwal⋅Dimase, Daniel⋅DiMase, Daniel⋅DiMase, Daniel⋅Tehranipoor, Mohammad and Tehranipoor, Mohammad
Journal of Electronic Testing, vol. 30, (no. 1), pp. 40, 20140200. | Journal Article
 
Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain
Guin, Ujjwal⋅Guin, Ujjwal⋅Huang, Ke⋅Ke Huang⋅DiMase, Daniel⋅DiMase, Daniel⋅Carulli, John M⋅Carulli, John M⋅Tehranipoor, Mohammad⋅Tehranipoor, Mohammad⋅Makris, Yiorgos and Makris, Yiorgos
Proceedings of the IEEE, vol. 102, (no. 8), pp. 1228, 2014-Aug.. | Journal Article
 
Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead
Guin, Ujjwal⋅Dimase, Daniel⋅DiMase, Daniel and Tehranipoor, Mohammad
Journal of Electronic Testing : (JETTA), vol. 30, (no. 1), pp. 9-23, Feb 2014. | Journal Article