52 Publications (Page 3 of 3)
1992
The influence of temperature on integrated circuit failure mechanisms
Pecht, Michael⋅Lall, Pradeep and Hakim, Edward B
Quality and Reliability Engineering International, vol. 8, (no. 3), pp. 176, 1992. | Journal Article
1990
Temperature dependence of microelectronic device failures
Pecht, Michael⋅Lall, Pradeep and Whelan, Stanley J
Quality and Reliability Engineering International, vol. 6, (no. 4), pp. 284, September/October 1990. | Journal Article
