61 Publications (Page 3 of 3)
1984
Anomalous MOS capacitance behavior in depletion-mode structures.Jaeger, Richard C and Gaensslen, F. HIEEE Transactions on Electron Devices, vol. ED-31, (no. 12), pp. 1916-1917, 1984.
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1983
An Efficient Numerical Algorithm for Simulation of MOS CapacitanceJaeger, Richard C⋅Gaensslen, F. H and Diehl, S. EIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 2, (no. 2), pp. 111-116, 1983.
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Efficient numerical algorithm for simulation of MOS capacitance.Jaeger, Richard C⋅Gaensslen, F. H and Diehl, S. EIEEE TRANS. COMP. AIDED DESIGN INTEGRATED CIRCUITS SYS., vol. CAD-2, (no. 2), pp. 111-116, 1983.
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1982
Analog data acquisition technology Part. III. -- Sample-and-holds, instrumentation amplifiers, and analog multiplexers.Jaeger, Richard CIEEE Micro, vol. 2, (no. 4), pp. 20-35, 1982.
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1981
Behavior of electrically small depletion mode MOSFETs at low temperatureGAENSSLEN, F. H and Jaeger, Richard CSolid-State Electronics, vol. 24, pp. 215-220, 1981.
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1980
CMRR Performance Limits of Analog Multiplexers Using Normal-Mode FiltersJaeger, Richard CIEEE TRANS. INSTR. AND MEAS., vol. IM-30, (no. 2), pp. 129-132, 1980.
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Simulation of impurity freezeout through numerical solution of Poisson's equation with application to MOS device behaviorJaeger, Richard C and Gaensslen, F. HIEEE Transactions on Electron Devices, vol. 27, (no. 5), pp. 914-920, 1980.
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1979
Simple analytical models for the temperature dependent threshold behavior of depletion-mode devicesJaeger, Richard C and Gaensslen, F. HIEEE Transactions on Electron Devices, vol. 26, (no. 4), pp. 501-508, 1979.
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1970
Low-frequency noise sources in bipolar junction transistorsJaeger, Richard C and Brodersen, A. JIEEE Transactions on Electron Devices, vol. 17, (no. 2), pp. 128-134, 1970.
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1969
LOW FREQUENCY NOISE SOURCES IN BIPOLAR JUNCTION TRANSISTORS (Dissertation)Jaeger, Richard C (1969).
n.d.no date or unknown
Optimal sizing of planar thermal spreadersHingorani, S.⋅Fahrner, CJ⋅Mackowski, DW⋅Gooding, JS and Jaeger, Richard CJournal of Heat Transfer, Transactions ASME, vol. 116, (no. 2), pp. 296-301.
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