102 Publications (Page 4 of 5)
2006
Depth-related contrast in aberration-corrected confocal STEMDe Jonge, N.⋅Lupini, A.R.⋅Van Benthem, K.⋅Borisevich, A.Y. and Pennycook, S.J.Microscopy and Microanalysis, vol. 12, pp. 1574-1575.
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Graded interface models for more accurate determination of van der Waals-London dispersion interactions across grain boundariesVan Benthem, K.⋅Tan, G.⋅French, R.H.⋅DeNoyer, L.K.⋅Podgornik, R. and Parsegian, V.A.Physical Review B - Condensed Matter and Materials Physics, vol. 74.
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Homogeneous Silica Formed by the Oxidation of Si(100) in Hyperthermal Atomic OxygenKisa, Maja⋅Li, Long⋅Yang, Judith⋅Minton, Timothy K⋅Stratton, William G⋅Voyles, Paul M⋅Chen, Xidong⋅Van Benthem, Klaus and Pennycook, Steve JJournal of Spacecraft and Rockets, vol. 43, (no. 2), pp. 431-435, 2006.
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Image formation based on atomic resolution core-loss electron energy loss spectroscopyOxley, MP⋅Van Benthem, K.⋅Benthem, K v⋅Varela, M⋅Findlay, Scott⋅Allen, L. J and Pennycook, SJMicroscopy and Microanalysis, vol. 12, pp. 1138-1139.
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The effect of interfacial layer properties on the performance of Hf-based gate stack devicesBersuker, G.⋅Park, C.S.⋅Barnett, J.⋅Lysaght, P.S.⋅Kirsch, P.D.⋅Young, C.D.⋅Choi, R.⋅Lee, B.H.⋅Foran, B.⋅Van Benthem, K.⋅Pennycook, S.J.⋅Lenahan, P.M. and Ryan, J.T.Journal of Applied Physics, vol. 100.
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Three-dimensional ADF imaging of individual atoms by through-focal series scanning transmission electron microscopyvan Benthem, Klaus⋅Benthem, K.⋅Lupini, Andrew R⋅Oxley, Mark P⋅Findlay, Scott⋅Allen, L. J and Pennycook, Stephen JUltramicroscopy, vol. 106, pp. 1062-1068.
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2005
Aberration corrected STEM analysis of nanowiresLupini, A.R.⋅Van Benthem, K.⋅Varela, M. and Pennycook, S.J.(pp. 11065-11069)
Atomic and electronic structure investigations of HfO 2/SiO 2/Si gate stacks using aberration-corrected STEMVan Benthem, K.⋅Rashkeev, S.N. and Pennycook, S.J.(pp. 79-84)
Bonding of thin Pd films on (100)SrTiO3 substrates: Ab initio density functional theory investigationsVan Benthem, K.⋅Elsässer, C. and Rühle, M.Physical Review B - Condensed Matter and Materials Physics, vol. 72.
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Increased ordering in the amorphous SiO x due to hyperthermal atomic oxygenKisa, M.⋅Stratton, W.G.⋅Minton, T.K.⋅Van Benthem, K.⋅Pennycook, S.J.⋅Voyles, P.M.⋅Chen, X.⋅Li, L. and Yang, J.C.(pp. 419-424)
Limitations to the measurement of oxygen concentrations by HRTEM imposed by surface roughnessLupini, Andrew R.⋅Chisholm, Matthew F.⋅Van Benthem, Klaus⋅Allen, Leslie J.⋅Oxley, Mark P.⋅Findlay, Scott D.⋅Varela, Maria⋅Pennycook, Stephen J.⋅Jia, Chun Lin⋅Lentzen, Markus and Urban, KnutMicroscopy and Microanalysis, vol. 11, pp. 111–115.
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Materials characterization in the aberration-corrected scanning transmission electron microscopeVarela, M.⋅Lupini, A.R.⋅Van Benthem, K.⋅Borisevich, A.Y.⋅Chisholm, M.F.⋅Shibata, N.⋅Abe, E. and Pennycook, S.J.(pp. 539-569)
Single Hf atoms inside the ultrathin SiO2 interlayer between a HfO2 dielectric film and the Si substrate: How do they modify the interface?Rashkeev, S.N.⋅Van Benthem, K.⋅Pantelides, S.T. and Pennycook, S.J.Microelectronic Engineering, vol. 80, pp. 416-419.
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Three-dimensional imaging of individual hafnium atoms inside a semiconductor devicevan Bentham, K⋅Van Benthem, K.⋅Lupini, Andrew⋅Kim, Miyoung⋅Baik, Hion⋅Doh, Seokjoo⋅Lee, Jong-Ho⋅Oxley, M⋅Findlay, Scott⋅Allen, Leslie⋅Luck, Julia and Pennycook, StephenApplied Physics Letters, vol. 87.
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Tomographic imaging of nanocrystals by aberration-corrected scanning transmission electron microscopyVan Benthem, K.⋅Peng, Y. and Pennycook, S.J.(pp. 3-7)
2004
High resolution EELS with the aberration corrected STEM: Determining interfacial electronic structures with high accuracyVan Benthem, K. and Pennycook, S.J.Microscopy and Microanalysis, vol. 10, pp. 260-261.
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Local optical properties, electron densities, and london dispersion energies of atomically structured grain boundaries.Van Benthem, Klaus⋅Tan, Guolong⋅DeNoyer, Linda K⋅French, Roger H and Rühle, ManfredPhysical review letters, vol. 93, (no. 22), pp. 227201, 2004/Nov/26.
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Preparation and characterisation of novel "sea-cucumber"-like structures containing carbon and boronLozano-Castelló, D.⋅Kamalakaran, R.⋅Van Benthem, K.⋅Phillipp, Y.J.⋅Grobert, N. and Rühle, M.Carbon, vol. 42, pp. 2223-2231.
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2003
Advances in EELS spectroscopy by using new detector and new specimen preparation technologiesScheu, C.⋅Gao, M.⋅Van Benthem, K.⋅Tsukimoto, S.⋅Schmidt, S.⋅Sigle, W.⋅Richter, G. and Thomas, J.Journal of Microscopy, vol. 210, pp. 16-24.
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Core-hole effect on the ELNES of SrTiO3: Experiment and theoryVan Benthem, K.⋅Elsässer, C. and Rühle, M.Microscopy and Microanalysis, vol. 9, pp. 68-69.
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Core-hole effects on the ELNES of absorption edges in SrTiO3Van Benthem, K.⋅Elsässer, C. and Rühle, M.Ultramicroscopy, vol. 96, pp. 509-522.
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Progress in the preparation of cross-sectional TEM specimens by ion-beam thinningStrecker, A.⋅Bäder, U.⋅Kelsch, M.⋅Salzberger, U.⋅Sycha, M.⋅Gao, M.⋅Richter, G. and Van Benthem, K.Zeitschrift fuer Metallkunde/Materials Research and Advanced Techniques, vol. 94, pp. 290-297.
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2002
Electronic structure investigations of Ni and Cr films on (100)SrTiO3 substrates using electron energy-loss spectroscopyVan Benthem, K.⋅Scheu, C.⋅Sigle, W. and Rühle, M.Zeitschrift fuer Metallkunde/Materials Research and Advanced Techniques, vol. 93, pp. 362-371.
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Structural and chemical analysis of materials with high spatial resolutionVan Benthem, K.⋅Krämer, S.⋅Sigle, W. and Rühle, M.Mikrochimica Acta, vol. 138-139, pp. 181-193.
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2001
Bulk electronic structure of SrTiO3: Experiment and theoryVan Benthem, K.⋅Elsässer, C. and French, R.H.Journal of Applied Physics, vol. 90, pp. 6156-6164.
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