102 Publications (Page 3 of 5)
2011
STEM imaging of single Pd atoms in activated carbon fibers considered for hydrogen storageVan Benthem, Klaus⋅Bonifacio, Cecile S⋅Contescu, Cristian I⋅Gallego, Nidia C and Pennycook, Stephen JCarbon, vol. 49, (no. 12), pp. 4059-4063, 2011.
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2010
Au on MgAl2O4 spinels: The effect of support surface properties in glycerol oxidationVilla, A.⋅Gaiassi, A.⋅Rossetti, I.⋅Bianchi, C.L.⋅Van Benthem, K.⋅Veith, G.M. and Prati, L.Journal of Catalysis, vol. 275, pp. 108-116.
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Field assisted sintering of nickel nanoparticles during in situ transmission electron microscopyHolland, T.B.⋅Thron, A.M.⋅Bonifacio, C.S.⋅Mukherjee, A.K. and Van Benthem, K.Applied Physics Letters, vol. 96.
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Observations on the influence of secondary me oxide additives (Me=Si, Al, Mg) on the microstructural evolution and mechanical behavior of silicon nitride ceramics containing RE2O3 (RE=La, Gd, Lu)Becher, P.F.⋅Shibata, N.⋅Painter, G.S.⋅Averill, F.⋅Van Benthem, K.⋅Lin, H.-T. and Waters, S.B.Journal of the American Ceramic Society, vol. 93, pp. 570-580.
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Strong immobilization of charge carriers near the surface of a solid oxide electrolyteKim, Sangtae⋅Jain, P.⋅Avila-Paredes, HJ⋅Thron, A.⋅van Benthem, K.⋅Van Benthem, K. and Sen, S.Journal of Materials Chemistry, vol. 20, pp. 3855-3858.
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2009
Atomic Resolution Investigation of Metal-Assisted Hydrogen Storage Mechanisms in Activated Carbon FibersBonifacio, C.S.⋅Thron, A.M.⋅Pennycook, S.J.⋅Contescu, C.I.⋅Gallego, N.C. and Van Benthem, K.Microscopy and Microanalysis, vol. 15, pp. 1426-1427.
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Characterization of EuS nanotubes in quantum confinementThron, A.M.⋅Bonifacio, C.S.⋅Erdman, N.⋅Harrison, M.A.⋅Somarajan, S.⋅Dickerson, J.H. and Van Benthem, K.Microscopy and Microanalysis, vol. 15, pp. 1178-1179.
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Europium sulfide nanoparticles in the sub-2 nm size regimeRedigolo, M.L.⋅Redígolo, M.L.⋅Koktysh, Dmitry⋅van Benthem, K.⋅Benthem, K.⋅Rosenthal, Sandra J and Dickerson, James HMaterials Chemistry and Physics, vol. 115, pp. 526-529.
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Imaging and spectroscopy of defects in semiconductors using aberration-corrected STEMVan Benthem, Klaus and Pennycook, Stephen JApplied Physics A: Materials Science & Processing, vol. 96, (no. 1), pp. 161-169, 2009.
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2008
Atomic scale investigations of ferroelectricity in perovskite thin filmsChisholm, M.F.⋅Lee, H.N. and Van Benthem, K.
Chapter 9 Materials Applications of Aberration-Corrected Scanning Transmission Electron MicroscopyPennycook, S.J.⋅Chisholm, M.F.⋅Lupini, A.R.⋅Varela, M.⋅Benthem, K.⋅Borisevich, A.Y.⋅Oxley, M.P.⋅Luo, W. and Pantelides, S.T.(pp. 327-384)
Experimental probe of adsorbate binding energies at internal crystalline/amorphous interfaces in Gd-doped Si3 N4Van Benthem, K.⋅Painter, G.S.⋅Averill, F.W.⋅Pennycook, S.J. and Becher, P.F.Applied Physics Letters, vol. 92.
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First-principles study of rare earth adsorption at β-Si 3N4 interfacesPainter, G.S.⋅Averill, F.W.⋅Becher, P.F.⋅Shibata, N.⋅Van Benthem, K. and Pennycook, S.J.Physical Review B - Condensed Matter and Materials Physics, vol. 78.
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Impurity segregation and ordering in Si/ SiO2 / HfO2 structuresMarinopoulos, A.G.⋅Van Benthem, K.⋅Rashkeev, S.N.⋅Pennycook, S.J. and Pantelides, S.T.Physical Review B - Condensed Matter and Materials Physics, vol. 77.
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Optimal doping control of magnetic semiconductors via subsurfactant epitaxyZeng, C.⋅Zhang, Z.⋅Van Benthem, K.⋅Chisholm, M.F. and Weitering, H.H.Physical Review Letters, vol. 100.
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Point defect configurations of supersaturated Au atoms inside Si nanowiresOh, Sang Ho⋅van Benthem, Klaus⋅Van Benthem, K.⋅Molina, Sergio I⋅Borisevich, Albina Y⋅Luo, Weidong⋅Werner, Peter⋅Zakharov, Nikolai D⋅Kumar, Dhananjay⋅Pantelides, Sokrates T and Pennycook, Stephen JNano Letters, vol. 8, pp. 1016-1019.
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Quantitative image contrast variations in STEMVan Benthem, K.⋅Oxley, M.P.⋅Kreyenschulte, C. and Pennycook, S.J.Microscopy and Microanalysis, vol. 14, pp. 942-943.
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2007
Aberration-corrected scanning transmission electron microscopy for atomic-scale characterization of semiconductor devicesVan Benthem, K. and Pennycook, S.J.(pp. 225-231)
Depth sectioning in scanning transmission electron microscopy based on core-loss spectroscopyD'alfonso, Adrian⋅D’Alfonso, A.J.⋅Findlay, Scott⋅Oxley, M P⋅Pennycook, S J⋅Benthem, K.⋅van Benthem, K⋅van Bentham, K and Allen, L. JUltramicroscopy, vol. 108, pp. 17-28.
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Dopant segregation and giant magnetoresistance in manganese-doped germaniumLi, A.P.⋅Zeng, C.⋅Van Benthem, K.⋅Chisholm, M.F.⋅Shen, J.⋅Nageswara Rao, S.V.S.⋅Dixit, S.K.⋅Feldman, L.C.⋅Petukhov, A.G.⋅Foygel, M. and Weitering, H.H.Physical Review B - Condensed Matter and Materials Physics, vol. 75.
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Interpreting atomic-resolution spectroscopic imagesOxley, M⋅Varela, M⋅Pennycook, T⋅Van Benthem, K.⋅van Bentham, K⋅Findlay, Scott⋅D’Alfonso, Adrian⋅Allen, Leslie and Pennycook, StephenPhysical Review B - Condensed Matter and Materials Physics, vol. 76.
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Scanning transmission electron microscopy for nanostructure characterizationPennycook, S.J.⋅Lupini, A.R.⋅Varela, M.⋅Borisevich, A.⋅Peng, Y.⋅Oxley, M.P.⋅Van Benthem, K. and Chisholm, M.F.(pp. 152-191)
2006
3D imaging with single atom sensitivity using confocal STEMVan Benthem, K.⋅De Jonge, N.⋅Borisevich, A.Y.⋅Oxley, M.P. and Pennycook, S.J.Microscopy and Microanalysis, vol. 12, pp. 1562-1563.
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Aberration-corrected STEM - More than just higher resolutionPennycook, S.J.⋅Chisholm, M.F.⋅Lupini, A.R.⋅Peng, Y.⋅Varela, M.⋅Van Benthem, K.⋅Borisevich, A.⋅De Jonge, N. and Oxley, M.P.Microscopy and Microanalysis, vol. 12, pp. 132-133.
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Characterization of metal-containing activated carbon fibers for hydrogen storageWu, X.⋅Van Benthem, K.⋅Tekinalp, H.⋅Gallego, N.C.⋅Contescu, C.I.⋅Baker, F.S. and Edie, D.D.