46 Publications (Page 2 of 2)
2014
Depth-resolved ultra-violet spectroscopic photo current-voltage measurements for the analysis of AlGaN/GaN high electron mobility transistor epilayer deposited on Si
Ozden, BurcuOzden, BurcuYang, ChungmanYang, ChungmanTong, FeiTong, FeiKhanal, Min PKhanal, Min PMirkhani, VahidMirkhani, VahidSk, Mobbassar HassanSk, Mobbassar HassanAhyi, Ayayi ClaudeAhyi, Ayayi ClaudePark, Minseo and Park, Minseo
Applied Physics Letters, vol. 105, (no. 17), pp. 172105, 2014-10-27. | Journal Article
 
High Channel Mobility 4H-SiC MOSFETs by Antimony Counter-Doping
Modic, AaronModic, AaronModic, AaronLiu, GangLiu, GangLiu, GangAhyi, Ayayi CAhyi, Ayayi CAhyi, Ayayi CZhou, YumingZhou, YumingZhou, YumingXu, PingyeXu, PingyeXu, PingyeHamilton, Michael CHamilton, Michael CHamilton, Michael CWilliams, John RWilliams, John RWilliams, John RFeldman, Leonard CFeldman, Leonard CFeldman, Leonard CDhar, SaritDhar, Sarit and Dhar, Sarit
IEEE Electron Device Letters, vol. 35, (no. 9), pp. 896, 2014-Sept.. | Journal Article
 
Roughness of the SiC/SiO{sub 2} vicinal interface and atomic structure of the transition layers
Liu, PeizhiLiu, PeizhiLi, GuoliangLi, GuoliangDuscher, GerdDuscher, GerdSharma, YogeshSharma, YogeshAhyi, AyayiAhyi, AyayiIsaacs-Smith, TamaraIsaacs-Smith, TamaraWilliams, JohnWilliams, JohnDhar, Sarit and Dhar, Sarit
Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films, vol. 32, (no. 6), 2014-11-01. | Journal Article
 
Thin PSG Process for 4H-SiC MOSFET
Feldman, Leonard CSharma, Yogesh KThomas, Stpehen MMawby, Philip AWilliams, JohnDhar, SaritXu, YiJennings, Michael RModic, AaronFisher, CraigIsaacs-Smith, TamaraGranfukel, Eric and Ahyi, Ayayi C
Materials Science Forum, vol. 778-780, pp. 516, 20140226. | Journal Article
2012
Flexible organic/inorganic hybrid solar cells based on conjugated polymer and ZnO nanorod array
Tong, FeiTong, FeiTong, FeiKim, KyusangKim, KyusangKim, KyusangMartinez, DanielMartinez, DanielMartinez, DanielThapa, ReshamThapa, ReshamThapa, ReshamAhyi, AyayiAhyi, AyayiAhyi, AyayiWilliams, JohnWilliams, JohnWilliams, JohnKim, Dong JooKim, Dong-JooKim, Dong-JooLee, SungkooLee, SungkooLee, SungkooLim, EunheeLim, EunheeLim, EunheeLee, Kyeong KLee, Kyeong KLee, Kyeong KPark, MinseoPark, Minseo and Park, Minseo
Semiconductor Science and Technology, vol. 27, (no. 10), pp. 105005, 2012-10-10. | Journal Article
 
Growth of ZnO Nanorod Arrays on Flexible Substrates: Effect of Precursor Solution Concentration
Tong, FeiTong, FeiTong, FeiKim, KyusangKim, KyusangKim, KyusangWang, YaqiWang, YaqiWang, YaqiThapa, ReshamThapa, ReshamThapa, ReshamSharma, YogeshSharma, YogeshSharma, YogeshModic, AaronModic, AaronModic, AaronAhyi, AyayiAhyi, AyayiAhyi, AyayiIssacs-Smith, TamaraIssacs-Smith, TamaraIssacs-Smith, TamaraWilliams, JohnWilliams, JohnWilliams, JohnAhn, HosangAhn, HosangAhn, HosangPark, HyejinPark, HyejinPark, HyejinKim, Dong-JooKim, Dong JooKim, Dong-JooLee, SungkooLee, SungkooLee, SungkooLim, EunheeLim, EunheeLim, EunheeLee, KyeongLee, KyeongLee, KyeongPark, MinseoPark, Minseo and Park, Minseo
ISRN Nanomaterials, vol. 2012, pp. 7, 2012. | Journal Article
 
Temperature Dependence of Inversion Layer Carrier Concentration and Hall Mobility in 4H-SiC MOSFETs
Ahyi, Ayayi ClaudeAgarwal, Anant KWilliams, John RDhar, SaritDhar, SaritRyu, Sei HyungAgarwal, Anant KWilliams, John RDhar, SaritRyu, Sei HyungAhyi, Ayayi ClaudeAhyi, Ayayi ClaudeWilliams, John RRyu, Sei Hyung and Agarwal, Anant K
Materials Science Forum, vol. 717-720, pp. 716, 20120514. | Journal Article
 
The Effects of Phosphorus at the SiO2/4H-SiC Interface
Ahyi, Ayayi ClaudePantelides, Sokrates TIssacs-Smith, TamaraShen, XiaoFeldman, Leonard CZhu, Xing GuangWilliams, John RGarfunkel, EricRozen, JohnXu, YiSharma, Yogesh KAhyi, Ayayi ClaudeIssacs-Smith, TamaraShen, XiaoZhu, Xing GuangGarfunkel, EricSharma, Yogesh K.Rozen, JohnXu, YiPantelides, Sokrates T.Williams, John R. and Feldman, Leonard C.
Materials Science Forum, vol. 717-720, pp. 746, 20120514. | Journal Article
2011
The effect of nitrogen plasma anneals on interface trap density and channel mobility for 4H–SiC MOS devices
Zhu, XingguangAhyi, Ayayi CLi, MingyuChen, ZengjunRozen, JohnFeldman, Leonard C and Williams, John R
Solid State Electronics, vol. 57, (no. 1), pp. 79, 2011. | Journal Article
2010
Ambient temperature characteristics of Schottky contacts on 4H–SiC aged in air at 350 °C
Adedeji, Adetayo VAdedeji, Adetayo VAhyi, Ayayi CAhyi, Ayayi CWilliams, John RWilliams, John RMohney, Suzanne EMohney, Suzanne ESchofield, James D and Scofield, James D
Solid State Electronics, vol. 54, (no. 7), pp. 740, 2010. | Journal Article
 
Structure and stoichiometry of (0001) 4H-SiC/oxide interface
Zhu, XingguangZhu, XingguangLee, HangLee, HangFeng, TianFeng, TianAhyi, AyayiAhyi, AyayiMastrogiovanni, DanielMastrogiovanni, DanielWan, AlanWan, AlanGarfunkel, EricGarfunkel, EricWilliams, JohnWilliams, JohnGustafsson, TorgnyGustafsson, TorgnyFeldman, Leonard and Feldman, Leonard
Applied Physics Letters, vol. 97, (no. 7), pp. 071908-3, 2010-08-19. | Journal Article
 
The Limits of Post Oxidation Annealing in NO
Rozen, JohnAhyi, Ayayi ClaudeFeldman, Leonard CZhu, Xing Guang and Williams, John R
Materials Science Forum, vol. 645-648, pp. 696, 20100429. | Journal Article
2007
Measurement of ultrashort laser pulses using single-crystal films of 4-aminobenzophenone
Bhowmik, Achintya KTan, ShidaAhyi, Ayayi CDharmadhikari, J.ADharmadhikari, A.K and Mathur, D
Optics Communications, vol. 280, (no. 2), pp. 476, 2007. | Journal Article
2006
Composite Ohmic Contacts to SiC
Ahyi, Ayayi ClaudeAdedeji, A.VBozack, M.JWilliams, John RLiu, BScofield, James D and Mohney, S.E
Materials Science Forum, vol. 527-529, pp. 882, 20061015. | Journal Article
 
Gamma Irradiation Effects on 4H-SiC MOS Capacitors and MOSFETs
Ahyi, Ayayi ClaudeWilliams, John R and Wang, S.R
Materials Science Forum, vol. 527-529, pp. 1066, 20061015. | Journal Article
 
Nitrogen and Hydrogen Induced Trap Passivation at the SiO2/4H-SiC Interface
Wang, S.RPantelides, Sokrates TFeldman, Leonard CDhar, SWilliams, John RIsaacs-Smith, TamaraDhar, SaritAhyi, Ayayi ClaudeWang, S.Ahyi, A. CIsaacs-Smith, T.Pantelides, StWilliams, J. R and Feldman, L. C
Materials Science Forum, vol. 527-529, pp. 954, 20061015. | Journal Article
2004
The effects of radiation type on the tolerance of high power 4h-SiC diodes
Z. Luo and Ahyi, Ayayi C
IEEE ttransactions on nuclear science, vol. 51, pp. 3748-3752, 2004. | Journal Article
2001
Temporal measurement on and using pulses from narrowed emission in styrylpyridinium cyanine dye
A.K. Dharmadhikari, A.K. Bhowmik, A.C. Ahyi, M. Thakur and Ahyi, Ayayi C
(pp. 3383-3385). November 2001
 
Temporal measurement on and using pulses from spectrally narrowed emission in styrylpyridinium cyanine dye
Dharmadhikari, Aditya KDharmadhikari, Aditya KBhowmik, Achintya KBhowmik, Achintya KAhyi, Ayayi CAhyi, Ayayi CThakur, Mrinal and Thakur, Mrinal
Applied Physics Letters, vol. 79, (no. 21), pp. 3385, 2001-11-19. | Journal Article
1999
acoustic scattering of impulsive geometrical waves by a glass sphere in water
V. latard,A. Merlen, V. Preobrazhenski, A.C. Ahyi and Ahyi, Ayayi C
(pp. 1919-1921). 29 Mar 1999
1998
Experimental demonstration of the pseudo-Rayleigh wave(A0)
A.C. Ahyi, P. Pernod, V. Latard, A. Merlen, H. Uberall and Ahyi, Ayayi C
(pp. 2727-2732). November 1998